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dc.contributor.authorXue, Hui
dc.contributor.authorKhawaja, Hassan Abbas
dc.contributor.authorMoatamedi, Mojtaba
dc.contributor.authorSun, Zhiheng
dc.date.accessioned2017-01-10T14:18:22Z
dc.date.available2017-01-10T14:18:22Z
dc.date.issued2016-12
dc.description.abstractIce adhesion causes many serious problems such as aircraft accidents, navigational issues on ships, and power loss on wind turbines. These challenges are mainly associated with the acute behavior of ice adhesion. The ice adheres when water seeps into the microscopic pores of the material substrate and freezes, thereby, forming an interlocking mechanism. Therefore, surface roughness has a significant effect on ice adhesion. In this study, an effort is being made to look at the ice adhesion over a non-toxic material SK One Component Polyurethane (SOCP) developed by China Institute of Water Resources & Hydropower Research (IWHR) in Beijing. The experimental analysis of ice adhesion will be carried out using four-point bending test set up in a cold room. The model will be analyzed theoretically using Euler–Bernoulli beam theory and the rule of mixtures. The experimental results will contain strain data gathered through data acquisition system using LabVIEW® software. In addition, numerical simulations will be performed using ANSYS® Workbench simulation software. The study will provide reliable data on the ice adhesion and build the basis for the application of SK One Component Polyurethane (SOCP) in the cold climate conditions.en_US
dc.descriptionPresentation held at The International Conference of Multiphysics (arranged by The International Conference of Multiphysics) in Zurich, 08.12.16 - 09.12.16.en_US
dc.identifier.cristinIDFRIDAID 1403459
dc.identifier.urihttps://hdl.handle.net/10037/10143
dc.language.isoengen_US
dc.rights.accessRightsopenAccessen_US
dc.subjectVDP::Teknologi: 500en_US
dc.subjectVDP::Technology: 500en_US
dc.titleStudy of Ice Adhesion Behavior of SK One Component Polyurethaneen_US
dc.typeConference objecten_US
dc.typeKonferansebidragen_US


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