dc.contributor.author | Mughal, Umair Najeeb | |
dc.contributor.author | Shu, Beibei | |
dc.date.accessioned | 2017-08-30T08:00:54Z | |
dc.date.available | 2017-08-30T08:00:54Z | |
dc.date.issued | 2016-10-31 | |
dc.description.abstract | The use of AD59333 IC for detecting atmospheric ice and atmospheric ice type was evaluated in this
article. A prototype circuit was developed and was tested using a frequency sweep from 40 Hz to 20 kHz. The IC
was calibrated using 100 kΩ resistor. The real and imaginary components of discrete Fourier transform were
recorded at each frequency increment in order calculate the gain factor at each frequency increment. The unknown
impedance was then calculated at each frequency increment. Results reflect that it was possible to use the dielectric
loss data to detect an icing event and however it was difficult to determine icing type using AD5933 IC. | en_US |
dc.description | Source at <a href=http://www.sensorsportal.com/HTML/DIGEST/october_2016/Vol_205/P_2875.pdf> http://www.sensorsportal.com/HTML/DIGEST/october_2016/Vol_205/P_2875.pdf </a> | en_US |
dc.identifier.citation | Mughal UN, Shu B. To Measure Relative Permittivity of Atmospheric Ice Using Frequency Sweep. Sensors & Transducers Journal. 2016;205(10):45-52 | en_US |
dc.identifier.cristinID | FRIDAID 1396045 | |
dc.identifier.issn | 1726-5479 | |
dc.identifier.uri | https://hdl.handle.net/10037/11401 | |
dc.language.iso | eng | en_US |
dc.publisher | IFSA Publishing | en_US |
dc.relation.journal | Sensors & Transducers Journal | |
dc.relation.projectID | eu-repo/grantAgreement/RCN/NORDSATS/195153/Norway/ColdTechSustainableColdClimateTechnology// | en_US |
dc.rights.accessRights | openAccess | en_US |
dc.subject | VDP::Teknologi: 500::Elektrotekniske fag: 540 | en_US |
dc.subject | VDP::Technology: 500::Electrotechnical disciplines: 540 | en_US |
dc.title | To Measure Relative Permittivity of Atmospheric Ice Using Frequency Sweep | en_US |
dc.type | Journal article | en_US |
dc.type | Tidsskriftartikkel | en_US |
dc.type | Peer reviewed | en_US |