Getting Hamaker coefficients with an amplitude-modulation AFM in tapping mode

Abstract

We demonstrate how to get Hamaker coefficients with an amplitude-modulation AFM operated in standard tapping mode. The Hamaker coefficient is a physical parameter that provides chemical information about the surface of samples. It is based or emerges from van der Waals forces. We use a Cypher scanning probe microscope from Asylum Research to demonstrate the method. The method is based on the research carried out at LENS during the 10s decade and early 20s.