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dc.contributor.advisorHellesø, Olav Gaute
dc.contributor.authorJensen, Mathias N.
dc.date.accessioned2021-06-29T18:56:51Z
dc.date.available2021-06-29T18:56:51Z
dc.date.issued2020-06-29
dc.description.abstractThe project explores the a proposed MIR-based measurement system for measuring the deflection of the interface between the crystal and melt during production of mono-crystalline Silicon in the Czochralski process. The absorption spectrum is modeled and the specific absorption for a select set of wavelengths is estimated for temperatures approching 1687K. It was estimated that the intrinsic absorption edge, corresponding to a photon wavelength of 1.107um had an absorption coefficient of 1.56e+4 cm-1, while a wavelength of 2.55um had an absorption of 13.76 cm-1. The optimum wavelength for transmittance through Silicon at 1687K was determined to be 2.16um for extrinsic material doped with 2.8e+16 cm-3 concentration of Boron. The measurement using a transmittance scan with a wavelength of 2.55um of a three samples yielded results with a maximum deviation of 8.8% from the true deflection. A ray tracing method based on reflecting the beam of the interface yielded a maximum error of 11.6% with a mean result deviating by 1.6%.en_US
dc.identifier.urihttps://hdl.handle.net/10037/21623
dc.language.isoengen_US
dc.publisherUiT Norges arktiske universiteten_US
dc.publisherUiT The Arctic University of Norwayen_US
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2020 The Author(s)
dc.rights.urihttps://creativecommons.org/licenses/by-nc-sa/4.0en_US
dc.rightsAttribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)en_US
dc.subject.courseIDFYS-3941
dc.subjectVDP::Matematikk og Naturvitenskap: 400::Fysikk: 430::Elektromagnetisme, akustikk, optikk: 434en_US
dc.subjectVDP::Mathematics and natural science: 400::Physics: 430::Electromagnetism, acoustics, optics: 434en_US
dc.titleMIR-based in-situ measurement of Silicon crystal-melt interfaceen_US
dc.typeMaster thesisen_US
dc.typeMastergradsoppgaveen_US


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Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
Med mindre det står noe annet, er denne innførselens lisens beskrevet som Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)