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dc.contributor.authorOlukan, Tuza Adeyemi
dc.contributor.authorSydorenko, Jekaterina
dc.contributor.authorKaterski, Atanas
dc.contributor.authorAl Mahri, Mariam
dc.contributor.authorLai, Chia-Yun
dc.contributor.authorAl-Hagri, Abdulrahman
dc.contributor.authorSantos Hernandez, Sergio
dc.contributor.authorChiesa, Matteo
dc.date.accessioned2022-11-23T14:03:44Z
dc.date.available2022-11-23T14:03:44Z
dc.date.issued2022-06-29
dc.description.abstractThe synthesis of TiO2 thin films by the chemical spray pyrolysis method at different titanium isopropoxide (TTIP) to acetylacetone (AcacH) ratios has been shown to lead to the highest photodegradation at 1 (TTIP):8 (AcacH). These films hold promise in the field of indoor pollution treatment. Carbon incorporation into the surface and into the TiO2 lattice could be responsible for the observed performance, but the mechanism is still to be elucidated. Here, we report the correlation of contact potential difference (CPD) contrast maps as produced using Kelvin Probe Force Microscopy, and the observed functionality dependence on the TTIP to AcacH ratio. Since the CPD contrast locally provides information about the sample’s Fermi level, this correlation provides a means to interpret enhanced photocatalytic activity in terms of the presence of acceptors that make possible a faster transfer of charge carriers to the surface.en_US
dc.identifier.citationOlukan, Sydorenko, Katerski, Al Mahri, Lai, Al-Hagri, Santos Hernandez, Chiesa. Insights into TiO<inf>2</inf>thin film photodegradation from Kelvin Probe AFM maps. Applied Physics Letters. 2022;121(3)en_US
dc.identifier.cristinIDFRIDAID 2045385
dc.identifier.doi10.1063/5.0098788
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttps://hdl.handle.net/10037/27505
dc.language.isoengen_US
dc.publisherAIP Publishingen_US
dc.relation.journalApplied Physics Letters
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/ERA/952509/Norway/ERA CHAIR OF EMERGING NEXT-GENERATION PHOTOVOLTAICS/5GSOLAR/en_US
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2022 The Author(s)en_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0en_US
dc.rightsAttribution 4.0 International (CC BY 4.0)en_US
dc.titleInsights into TiO<inf>2</inf>thin film photodegradation from Kelvin Probe AFM mapsen_US
dc.type.versionpublishedVersionen_US
dc.typeJournal articleen_US
dc.typeTidsskriftartikkelen_US
dc.typePeer revieweden_US


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Attribution 4.0 International (CC BY 4.0)
Except where otherwise noted, this item's license is described as Attribution 4.0 International (CC BY 4.0)