Show simple item record

dc.contributor.authorYallew, Henock Demessie
dc.contributor.authorJágerská, Jana
dc.contributor.authorGreve, Martin Møller
dc.date.accessioned2023-02-03T08:17:14Z
dc.date.available2023-02-03T08:17:14Z
dc.date.issued2022-12-06
dc.description.abstractWe use the fixed beam moving stage (FBMS) electron beam lithography technique to pattern a 10 mm long slot waveguide with s-bend tapered double-tip couplers. The fabrication method solves two major limitations of the FBMS mode, namely, the requirement for fixed-width structures and the incidence of stage placement drift for patterns involving elements of different widths. This has been achieved by fracturing the outline of the structure into fixed-width elements of gradually increasing width and creating intermediate overlap areas between the elements to mitigate the stage placement drifts.en_US
dc.identifier.citationYallew HD, Jágerská J, Greve MM. Long, stitch-free slot waveguide with s-bend tapered couplers for IR-sensing applications using electron beam lithography. Journal of Vacuum Science & Technology B. 2022en_US
dc.identifier.cristinIDFRIDAID 2099480
dc.identifier.doi10.1116/6.0002187
dc.identifier.issn1071-1023
dc.identifier.issn1520-8567
dc.identifier.urihttps://hdl.handle.net/10037/28482
dc.language.isoengen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.journalJournal of Vacuum Science & Technology B
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/H2020/758973/Norway/Cryptophane-Enhanced Trace Gas Spectroscopy for On-Chip Methane Detection/sCENT/en_US
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2022 The Author(s)en_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0en_US
dc.rightsAttribution 4.0 International (CC BY 4.0)en_US
dc.titleLong, stitch-free slot waveguide with s-bend tapered couplers for IR-sensing applications using electron beam lithographyen_US
dc.type.versionacceptedVersionen_US
dc.typeJournal articleen_US
dc.typeTidsskriftartikkelen_US
dc.typePeer revieweden_US


File(s) in this item

Thumbnail

This item appears in the following collection(s)

Show simple item record

Attribution 4.0 International (CC BY 4.0)
Except where otherwise noted, this item's license is described as Attribution 4.0 International (CC BY 4.0)