• Automatic Generation of Contrast Maps in Terms of van der Waals Material Properties in Bimodal AFM 

      Santos Hernandez, Sergio; Elsherbiny, Lamiaa; Lai, Chia-Yun; Askar, Khalid; Gadelrab, Karim; Chiesa, Matteo (Journal article; Tidsskriftartikkel; Peer reviewed, 2024-11-26)
      van der Waals (vdW) forces are of interest in colloid science, biophysics, cell biology, and the field of vdW heterostructures. We present a model and method to quantify vdW material properties of samples routinely in standard bimodal atomic force microscopy (AFM) without the need to establish mechanical contact with the samples. The method preserves the high resolution of bimodal AFM but ...