ub.xmlui.mirage2.page-structure.muninLogoub.xmlui.mirage2.page-structure.openResearchArchiveLogo
    • EnglishEnglish
    • norsknorsk
  • Velg spraakEnglish 
    • EnglishEnglish
    • norsknorsk
  • Administration/UB
View Item 
  •   Home
  • Fakultet for naturvitenskap og teknologi
  • Institutt for teknologi og sikkerhet
  • Artikler, rapporter og annet (teknologi og sikkerhet)
  • View Item
  •   Home
  • Fakultet for naturvitenskap og teknologi
  • Institutt for teknologi og sikkerhet
  • Artikler, rapporter og annet (teknologi og sikkerhet)
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Endurance Test on Carbon Film Fixed Resistor under Escalated Voltage Stress

Permanent link
https://hdl.handle.net/10037/14833
DOI
https://doi.org/10.1088/1757-899X/423/1/012117
Thumbnail
View/Open
article.pdf (1.584Mb)
published version (PDF)
Date
2018
Type
Journal article
Peer reviewed
Tidsskriftartikkel

Author
Yuan, Fuqing; Lu, Jinmei
Abstract
Film fixed resistor is a basic unit in the electronic devices. As it is less frequently failed than other units such as capacitor, the reliability and robustness of it are less concerned both in the academics and in the industries. This paper investigates the endurance of the carbon film fixed resistor. The resistance shift and life of it under the escalated voltage stress level are the aim. A PCB board is designed to test the performance under various voltage stress levels. It was observed at lower stress level, the resistance can maintain the resistance in certain level, and can function even they burned. However, at high stress level, the resistor will also burn but the resistance will be extremely high to reach unacceptable level. The individual difference is obvious due to material dissimilarities. Resultantly, the life of the resistor is far deterministic but uncertain. A life model is developed in this paper to capture the uncertainty.
Description
Published version, licensed under the terms of the Creative Commons Attribution 3.0
Source at https://doi.org/10.1088/1757-899X/423/1/012117
Publisher
IOP Publishing
Citation
Yuan F, Lu J.(2018) Endurance Test on Carbon Film Fixed Resistor under Escalated Voltage Stress. IOP Conference Series: Materials Science and Engineering. 423,(1), 6 s. https://doi.org/10.1088/1757-899X/423/1/012117
Metadata
Show full item record
Collections
  • Artikler, rapporter og annet (teknologi og sikkerhet) [361]

Browse

Browse all of MuninCommunities & CollectionsAuthor listTitlesBy Issue DateBrowse this CollectionAuthor listTitlesBy Issue Date
Login

Statistics

View Usage Statistics
UiT

Munin is powered by DSpace

UiT The Arctic University of Norway
The University Library
uit.no/ub - munin@ub.uit.no

Accessibility statement (Norwegian only)