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dc.contributor.authorCoucheron, David Andre
dc.contributor.authorHelle, Øystein I.
dc.contributor.authorWilkinson, James S.
dc.contributor.authorMurugan, Ganapathy Senthil
dc.contributor.authorDomínguez, Carlos
dc.contributor.authorAngelskår, Hallvard
dc.contributor.authorAhluwalia, Balpreet S.
dc.date.accessioned2021-10-05T06:37:07Z
dc.date.available2021-10-05T06:37:07Z
dc.date.issued2021-06-17
dc.description.abstractOn-chip super-resolution optical microscopy is an emerging field relying on waveguide excitation with visible light. Here, we investigate two commonly used high-refractive index waveguide platforms, tantalum pentoxide (Ta<sub>2</sub>O<sub>5</sub>) and silicon nitride (Si<sub>3</sub>N<sub>4</sub>), with respect to their background with excitation in the range 488–640 nm. The background strength from these waveguides were estimated by imaging fluorescent beads. The spectral dependence of the background from these waveguide platforms was also measured. For 640 nm wavelength excitation both the materials had a weak background, but the background increases progressively for shorter wavelengths for Si<sub>3</sub>N<sub>4</sub>. We further explored the effect of the waveguide background on localization precision of single molecule localization for <i>direct</i> stochastic optical reconstruction microscopy (<i>d</i>STORM). An increase in background for Si<sub>3</sub>N<sub>4</sub> at 488 nm is shown to reduce the localization precision and thus the resolution of the reconstructed images. The localization precision at 640nm was very similar for both the materials. Thus, for shorter wavelength applications Ta<sub>2</sub>O<sub>5</sub> is preferable. Reducing the background from Si<sub>3</sub>N<sub>4</sub> at shorter wavelengths via improved fabrication will be worth pursuing.en_US
dc.identifier.citationCoucheron DA, HELLE, Wilkinson, MURUGAN, DOMINGUEZ, Angelskår, AHLUWALIA. Study of waveguide background at visible wavelengths for on-chip nanoscopy. Optics Express. 2021;29(13):20735-20746en_US
dc.identifier.cristinIDFRIDAID 1922923
dc.identifier.doi10.1364/OE.420844
dc.identifier.issn1094-4087
dc.identifier.urihttps://hdl.handle.net/10037/22714
dc.language.isoengen_US
dc.publisherOptical Society of Americaen_US
dc.relation.journalOptics Express
dc.relation.projectIDinfo:eu-repo/grantAgreement/RCN/BIOTEK2021/285571/Norway/Optimalisering: High-throughput and high-resolution pathology using chip-based nanoscopy/Nano-Path/en_US
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2021 The Author(s)en_US
dc.subjectVDP::Technology: 500en_US
dc.subjectVDP::Teknologi: 500en_US
dc.titleStudy of waveguide background at visible wavelengths for on-chip nanoscopyen_US
dc.type.versionpublishedVersionen_US
dc.typeJournal articleen_US
dc.typeTidsskriftartikkelen_US
dc.typePeer revieweden_US


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