dc.contributor.author | Yuan, Fuqing | |
dc.contributor.author | Lu, Jinmei | |
dc.date.accessioned | 2019-03-05T09:46:10Z | |
dc.date.available | 2019-03-05T09:46:10Z | |
dc.date.issued | 2018 | |
dc.description.abstract | Film fixed resistor is a basic unit in the electronic devices. As it is less frequently failed than other units such as capacitor, the reliability and robustness of it are less concerned both in the academics and in the industries. This paper investigates the endurance of the carbon film fixed resistor. The resistance shift and life of it under the escalated voltage stress level are the aim. A PCB board is designed to test the performance under various voltage stress levels. It was observed at lower stress level, the resistance can maintain the resistance in certain level, and can function even they burned. However, at high stress level, the resistor will also burn but the resistance will be extremely high to reach unacceptable level. The individual difference is obvious due to material dissimilarities. Resultantly, the life of the resistor is far deterministic but uncertain. A life model is developed in this paper to capture the uncertainty. | en_US |
dc.description | Published version, licensed under the terms of the <a href=https://creativecommons.org/licenses/by/3.0/>Creative Commons Attribution 3.0 </a> <br> Source at <a href=https://doi.org/10.1088/1757-899X/423/1/012117>https://doi.org/10.1088/1757-899X/423/1/012117</a> | en_US |
dc.identifier.citation | Yuan F, Lu J.(2018) Endurance Test on Carbon Film Fixed Resistor under Escalated Voltage Stress. <i>IOP Conference Series: Materials Science and Engineering. 423,</i>(1), 6 s. https://doi.org/10.1088/1757-899X/423/1/012117 | en_US |
dc.identifier.cristinID | FRIDAID 1636784 | |
dc.identifier.doi | 10.1088/1757-899X/423/1/012117 | |
dc.identifier.issn | 1757-8981 | |
dc.identifier.issn | 1757-899X | |
dc.identifier.uri | https://hdl.handle.net/10037/14833 | |
dc.language.iso | eng | en_US |
dc.publisher | IOP Publishing | en_US |
dc.relation.journal | IOP Conference Series: Materials Science and Engineering | |
dc.rights.accessRights | openAccess | en_US |
dc.subject | VDP::Technology: 500 | en_US |
dc.subject | VDP::Teknologi: 500 | en_US |
dc.title | Endurance Test on Carbon Film Fixed Resistor under Escalated Voltage Stress | en_US |
dc.type | Journal article | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Tidsskriftartikkel | no |