Show simple item record

dc.contributor.authorZhao, Zihang
dc.contributor.authorLang, Wenhui
dc.contributor.authorDoulgeris, Anthony Paul
dc.contributor.authorChen, Lu
dc.date.accessioned2019-06-24T09:07:31Z
dc.date.available2019-06-24T09:07:31Z
dc.date.issued2017-12-04
dc.description.abstractThis paper is focused on investigations of the improved correction of the effect of variation in incidence angle on ScanSAR data. Conventional correction methods (such as LLM, locally linear mapping) typically assume that each target class has a similarity distribution in the middle of the image. The objectives of this study are to extend the correction algorithm to full swath width without any assumptions. For a target class only distributed on one or both sides of the image, interpolation or extrapolation of the confidence interval is realized using the linear regression technique based on the exponential model. The position of the reference band is then determined and the correction is performed. Experiments were performed on ENVISAT ASAR and RADARSAT-2 ScanSAR data. The results show the effectiveness of the proposed method.en_US
dc.description.sponsorshipThis work was supported in part by the National Natural Science Foundation of China under Grants No.61271381, No.61371154 and No.61102154. A.P. Doulgeris has been funded by the Norwegian Research Council (NFR) through the Centre for Integrated Remote Sensing and Forecasting for Arctic Operations (CIRFA) (NFR project number 237906).en_US
dc.descriptionAccepted manuscript file. Publisher's version available at: <a href=http://dx.doi.org/10.1109/IGARSS.2017.8128212>http://dx.doi.org/10.1109/IGARSS.2017.8128212</a>en_US
dc.identifier.citationZhao, Zihang, Lang, Wenhui, Doulgeris, Anthony Paul, Chen, Lu. (2017) Improved LLM Methods Using Linear Regression. <i>Proceedings of 2017 IEEE International Geoscience and Remote Sensing Symposium (5350-5353). 10.1109/IGARSS.2017.8128212en_US
dc.identifier.cristinIDFRIDAID 1517965
dc.identifier.doi10.1109/IGARSS.2017.8128212
dc.identifier.issn2153-6996
dc.identifier.issn2153-7003
dc.identifier.urihttps://hdl.handle.net/10037/15589
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.journalIEEE International Geoscience and Remote Sensing Symposium proceedings
dc.relation.projectIDNorges forskningsråd: 237906en_US
dc.rights.accessRightsopenAccessen_US
dc.subjectVDP::Technology: 500en_US
dc.subjectVDP::Teknologi: 500en_US
dc.titleImproved LLM Methods Using Linear Regressionen_US
dc.typeJournal articleen_US
dc.typePeer revieweden_US


File(s) in this item

Thumbnail

This item appears in the following collection(s)

Show simple item record