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dc.contributor.authorLai, Chia-Yun
dc.contributor.authorSantos Hernandez, Sergio
dc.contributor.authorMoser, Toni
dc.contributor.authorAlfakes, Boulos
dc.contributor.authorLu, Chun-Yu
dc.contributor.authorOlukan, Tuza Adeyemi
dc.contributor.authorRajput, Nitul
dc.contributor.authorBoström, Tobias
dc.contributor.authorChiesa, Matteo
dc.date.accessioned2023-09-22T10:57:15Z
dc.date.available2023-09-22T10:57:15Z
dc.date.issued2020-02-04
dc.description.abstractNon-monotonic behavior has been observed in the optoelectronic properties of ZnO thin films as doped with Hf (HZO). Here we propose that two competing mechanisms are responsible for such behaviour. Specifically, we propose that provided two crystal orientations dominate film growth, only one of them might be responsible for direct Hf substitution. Nonmonotonic behaviour is expected at once by considering that preferential growth of the crystal that allows for direct Hf substitution is inhibited by Hf concentration in the manufacturing process. This inhibition would also be a thermodynamic consequence of Hf substitution. Maxima in Hf substitution is thus reached at a point where enough crystals exhibit the preferential orientation, and where enough Hf is present on the surface for substitution. Outside this optimum scenario, Hf substitution can only decrease. We interpret the surface phenomena by discussing surface energy and the van der Waals forces as measured experimentally by means of atomic force microscopy.en_US
dc.identifier.citationLai, Santos Hernandez SH, Moser, Alfakes, Lu C, Olukan TA, Rajput, Boström, Chiesa. Explaining doping in material research (Hf substitution in ZnO films) by directly quantifying the van der Waals force. Physical Chemistry, Chemical Physics - PCCP. 2020;22(7):4130-4137en_US
dc.identifier.cristinIDFRIDAID 1885838
dc.identifier.doi10.1039/c9cp06441a
dc.identifier.issn1463-9076
dc.identifier.issn1463-9084
dc.identifier.urihttps://hdl.handle.net/10037/31171
dc.language.isoengen_US
dc.publisherRoyal Society of Chemistryen_US
dc.relation.journalPhysical Chemistry, Chemical Physics - PCCP
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2020 The Author(s)en_US
dc.titleExplaining doping in material research (Hf substitution in ZnO films) by directly quantifying the van der Waals forceen_US
dc.type.versionacceptedVersionen_US
dc.typeJournal articleen_US
dc.typeTidsskriftartikkelen_US
dc.typePeer revieweden_US


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