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dc.contributor.authorGámiz, María Luz
dc.contributor.authorNavas-Gómez, Fernando
dc.contributor.authorNozal Canadas, Rafael Adolfo
dc.contributor.authorRaya-Miranda, Rocío
dc.date.accessioned2025-01-20T12:33:51Z
dc.date.available2025-01-20T12:33:51Z
dc.date.issued2024-12-11
dc.description.abstractStudying the reliability of complex systems using machine learning techniques involves facing a series of technical and practical challenges, ranging from the intrinsic nature of the system and data to the difficulties in modeling and effectively deploying models in real-world scenarios. This study compares the effectiveness of classical statistical techniques and machine learning methods for improving complex system analysis in reliability assessments. Our goal is to show that in many practical applications, traditional statistical algorithms frequently produce more accurate and interpretable results compared with black-box machine learning methods. The evaluation is conducted using both real-world data and simulated scenarios. We report the results obtained from statistical modeling algorithms, as well as from machine learning methods including neural networks, K-nearest neighbors, and random forests.en_US
dc.identifier.citationGámiz, Navas-Gómez, Nozal Canadas, Raya-Miranda. Towards the Best Solution for Complex System Reliability: Can Statistics Outperform Machine Learning?. Machines. 2024;12(12)en_US
dc.identifier.cristinIDFRIDAID 2342365
dc.identifier.doi10.3390/machines12120909
dc.identifier.issn2075-1702
dc.identifier.urihttps://hdl.handle.net/10037/36231
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.relation.journalMachines
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2024 The Author(s)en_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0en_US
dc.rightsAttribution 4.0 International (CC BY 4.0)en_US
dc.titleTowards the Best Solution for Complex System Reliability: Can Statistics Outperform Machine Learning?en_US
dc.type.versionpublishedVersionen_US
dc.typeJournal articleen_US
dc.typeTidsskriftartikkelen_US
dc.typePeer revieweden_US


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Attribution 4.0 International (CC BY 4.0)
Except where otherwise noted, this item's license is described as Attribution 4.0 International (CC BY 4.0)