• Demonstrating low Raman background in UV-written SiO2 waveguides 

      Jensen, Mathias Novik; Gates, James C.; Flint, Alex I.; Hellesø, Olav Gaute (Journal article; Tidsskriftartikkel; Peer reviewed, 2023-09-06)
      Raman spectroscopy can give a chemical ’fingerprint’ from both inorganic and organic samples, and has become a viable method of measuring the chemical composition of single biological particles. In parallel, integration of waveguides and microfluidics allows for the creation of miniaturized optical sensors in lab-on-a-chip devices. The prospect of combining integrated optics and Raman spectroscopy ...
    • Evaluation of crystalline structure quality of Czochralski-silicon using near-infrared tomography 

      Jensen, Mathias Novik; Hellesø, Olav Gaute (Journal article; Tidsskriftartikkel; Peer reviewed, 2022-01-22)
      In this work, three silicon samples are subject to tomographic scans using a 1.6μm laser. The samples were prematurely terminated due to anomalies during the Czhochralski-process. They are taken as analogues of the in situ crystal, where one sample has known aberrant structure in its lowermost 45 mm. The results of the tomographic scans show a distinct difference in transmission profile between ...