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dc.contributor.authorSloyan, Karen
dc.contributor.authorMelkonyan, Henrik
dc.contributor.authorApostoleris, Harry
dc.contributor.authorDahlem, Marcus S.
dc.contributor.authorChiesa, Matteo
dc.contributor.authorAl Ghaferi, Amal
dc.date.accessioned2022-03-04T23:58:39Z
dc.date.available2022-03-04T23:58:39Z
dc.date.issued2021-09-02
dc.description.abstractFocused ion beam (FIB) technology has become a promising technique in micro- and nano-prototyping due to several advantages over its counterparts such as direct (maskless) processing, sub-10 nm feature size, and high reproducibility. Moreover, FIB machining can be effectively implemented on both conventional planar substrates and unconventional curved surfaces such as optical fibers, which are popular as an effective medium for telecommunications. Optical fibers have also been widely used as intrinsically light-coupled substrates to create a wide variety of compact fiber-optic devices by FIB milling diverse micro- and nanostructures onto the fiber surface (endfacet or outer cladding). In this paper, the broad applications of the FIB technology in optical fibers are reviewed. After an introduction to the technology, incorporating the FIB system and its basic operating modes, a brief overview of the lab-on-fiber technology is presented. Furthermore, the typical and most recent applications of the FIB machining in optical fibers for various applications are summarized. Finally, the reviewed work is concluded by suggesting the possible future directions for improving the micro- and nanomachining capabilities of the FIB technology in optical fibers.en_US
dc.descriptionThis is the Accepted Manuscript version of an article accepted for publication in <i>Nanotechnology</i>. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at <a href=https://doi.org/10.1088/1361-6528/ac1d75>https://doi.org/10.1088/1361-6528/ac1d75</a>.en_US
dc.identifier.citationSloyan, Melkonyan, Apostoleris, Dahlem, Chiesa, Al Ghaferi. A review of focused ion beam applications in optical fibers. Nanotechnology. 2021;32en_US
dc.identifier.cristinIDFRIDAID 1938339
dc.identifier.doi10.1088/1361-6528/ac1d75
dc.identifier.issn0957-4484
dc.identifier.issn1361-6528
dc.identifier.urihttps://hdl.handle.net/10037/24270
dc.language.isoengen_US
dc.publisherIOP Publishingen_US
dc.relation.journalNanotechnology
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2021 The Author(s)en_US
dc.titleA review of focused ion beam applications in optical fibersen_US
dc.type.versionacceptedVersionen_US
dc.typeJournal articleen_US
dc.typeTidsskriftartikkelen_US
dc.typePeer revieweden_US


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