dc.contributor.author | Qin, Yingying | |
dc.contributor.author | Butola, Ankit | |
dc.contributor.author | Agarwal, Krishna | |
dc.date.accessioned | 2023-09-04T11:26:51Z | |
dc.date.available | 2023-09-04T11:26:51Z | |
dc.date.issued | 2023-04-21 | |
dc.description.abstract | A rigorous forward model solver for conventional coherent microscope is presented. The forward model is derived from Maxwell’s equations and models the wave behaviour of light matter interaction. Vectorial waves and multiple-scattering effect are considered in this model. Scattered field can be calculated with given distribution of the refractive index of the biological sample. Bright field images can be obtained by combining the scattered field and reflected illumination, and experimental validation is included. Insights into the utility of the full-wave multi-scattering (FWMS) solver and comparison with the conventional Born approximation based solver are presented. The model is also generalizable to the other forms of label-free coherent microscopes, such as quantitative phase microscope and dark-field microscope. | en_US |
dc.identifier.citation | Qin, Butola, Agarwal. 3D full-wave multi-scattering forward solver for coherent microscopes. Optics Express. 2023;31(9):15015-15034 | en_US |
dc.identifier.cristinID | FRIDAID 2150545 | |
dc.identifier.doi | 10.1364/OE.480578 | |
dc.identifier.issn | 1094-4087 | |
dc.identifier.uri | https://hdl.handle.net/10037/30673 | |
dc.language.iso | eng | en_US |
dc.publisher | Optica Publishing Group | en_US |
dc.relation.journal | Optics Express | |
dc.rights.accessRights | openAccess | en_US |
dc.rights.holder | Copyright 2023 The Author(s) | en_US |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0 | en_US |
dc.rights | Attribution 4.0 International (CC BY 4.0) | en_US |
dc.title | 3D full-wave multi-scattering forward solver for coherent microscopes | en_US |
dc.type.version | publishedVersion | en_US |
dc.type | Journal article | en_US |
dc.type | Tidsskriftartikkel | en_US |
dc.type | Peer reviewed | en_US |