Gámiz, María Luz; Kalén, Anton; Nozal Cañadas, Rafael; Raya-Miranda, Rocío (Journal article; Tidsskriftartikkel; Peer reviewed, 2022-04-04)
Our practical motivation is the analysis of potential correlations between spectral noise current and threshold voltage from common on-wafer MOSFETs. The usual strategy leads to the use of standard techniques based on Normal linear regression easily accessible in all statistical software (both free or commercial). However, these statistical methods are not appropriate because the assumptions they ...