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Getting Hamaker coefficients with an amplitude-modulation AFM in tapping mode

dc.contributor.authorLai, Chia-Yun
dc.contributor.authorOlukan, Tuza Adeyemi
dc.contributor.authorSantos, Sergio
dc.contributor.authorChiesa, Matteo
dc.date.accessioned2020-08-18T10:20:54Z
dc.date.available2020-08-18T10:20:54Z
dc.date.issued2020-07
dc.description.abstractWe demonstrate how to get Hamaker coefficients with an amplitude-modulation AFM operated in standard tapping mode. The Hamaker coefficient is a physical parameter that provides chemical information about the surface of samples. It is based or emerges from van der Waals forces. We use a Cypher scanning probe microscope from Asylum Research to demonstrate the method. The method is based on the research carried out at LENS during the 10s decade and early 20s.en_US
dc.identifier.citationLai, C.Y., Olukan, T., Santos, S. & Chiesa, M. (2020). <i>Getting Hamaker coefficients with an amplitude-modulation AFM in tapping mode</i>. (Laboratory for Energy and NanoScience Compendium: Chapter 3). Tromsø: UiT The Arctic University of Norway. 14 pp.en_US
dc.identifier.cristinIDFRIDAID 1819580
dc.identifier.urihttps://hdl.handle.net/10037/19011
dc.language.isoengen_US
dc.publisherUiT The Arctic University of Norwayen_US
dc.relation.ispartofseriesLaboratory for Energy and NanoScience Compendium: Chapter 3
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2020 The Author(s)en_US
dc.subjectVDP::Technology: 500::Nanotechnology: 630en_US
dc.subjectVDP::Teknologi: 500::Nanoteknologi: 630en_US
dc.titleGetting Hamaker coefficients with an amplitude-modulation AFM in tapping modeen_US
dc.type.versionpublishedVersionen_US
dc.typeResearch reporten_US
dc.typeForskningsrapporten_US


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